Characterization of BaTiO3 thin films on p-Si

Evangelou, E.K., Konofaos, N., Aslanoglou, X., Kennou, S. and Thomas, C.B., 2001. Characterization of BaTiO3 thin films on p-Si. Materials Science in Semiconductor Processing, 4, pp. 305-307. ISSN 1369-8001

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Item Type:	Journal article
Publication Title:	Materials Science in Semiconductor Processing
Creators:	Evangelou, E.K., Konofaos, N., Aslanoglou, X., Kennou, S. and Thomas, C.B.
Publisher:	Elsevier Sci Ltd.
Place of Publication:	Kidlington, Oxford
Date:	2001
Volume:	4
ISSN:	1369-8001
Divisions:	Schools > School of Science and Technology
Record created by:	EPrints Services
Date Added:	09 Oct 2015 10:40
Last Modified:	19 Oct 2015 14:35
URI:	https://irep.ntu.ac.uk/id/eprint/16332

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