Characterization of BaTiO3 thin films on p-Si

EVANGELOU, E.K., KONOFAOS, N., ASLANOGLOU, X., KENNOU, S. and THOMAS, C.B., 2001. Characterization of BaTiO3 thin films on p-Si. Materials Science in Semiconductor Processing, 4, pp. 305-307. ISSN 1369-8001

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Item Type: Journal article
Publication Title: Materials Science in Semiconductor Processing
Creators: Evangelou, E.K., Konofaos, N., Aslanoglou, X., Kennou, S. and Thomas, C.B.
Publisher: Elsevier Sci Ltd.
Place of Publication: Kidlington, Oxford
Date: 2001
Volume: 4
ISSN: 1369-8001
Divisions: Schools > School of Science and Technology
Depositing User: EPrints Services
Date Added: 09 Oct 2015 10:40
Last Modified: 19 Oct 2015 14:35
URI: http://irep.ntu.ac.uk/id/eprint/16332

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