Cranton, WM ORCID: https://orcid.org/0000-0002-0142-7810, Spink, DM, Stevens, R and Thomas, CB, 1993. Growth and dielectic characterization of yttrium oxide thin films deposited on SI by r.f.- magnetron sputtering. Thin Solid Films, 226 (1), pp. 156-160.
Full text not available from this repository.Item Type: | Journal article |
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Publication Title: | Thin Solid Films |
Creators: | Cranton, W.M., Spink, D.M., Stevens, R. and Thomas, C.B. |
Date: | 1993 |
Volume: | 226 |
Number: | 1 |
Divisions: | Schools > School of Science and Technology |
Record created by: | EPrints Services |
Date Added: | 09 Oct 2015 10:55 |
Last Modified: | 24 Mar 2022 14:48 |
URI: | https://irep.ntu.ac.uk/id/eprint/20194 |
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