McHale, G., Martin, F. and Newton, M.I. ORCID: 0000-0003-4231-1002, 2002. Mass sensitivity of acoustic wave devices from group and phase velocity measurements. Journal of Applied Physics, 92 (6), pp. 3368-3373. ISSN 0021-8979
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Abstract
The effect of dispersion on acoustic wave sensors is considered. The discussion is focused upon layer guided surface acoustic waves ~Love waves!, which obtain their high mass sensitivity for the first Love wave mode by optimizing the guiding layer thickness, d, such that d;ll/4; the wavelength in the layer is given by ll5f /vl where f is the operating frequency and vl is the shear acoustic speed of the guiding layer. We show that this optimization of guiding layer thickness corresponds to strong dispersion so that the phase and group velocities can be quite different. From the definition of the phase velocity mass sensitivity, we show that it can be determined from either the slope of the curve of phase velocity with normalized guiding layer thickness, z5d/ll , or from the phase and group velocities measured for a given guiding layer thickness. Experimental data for a poly~methylmethacrylate! polymer guiding layer on 36° XY Lithium Tantalate is presented. Measurements of phase velocity and group velocity determined by a network analyzer were obtained for systematically increasing guiding layer thicknesses; a pulse transit experiment was also used to provide independent confirmation of the group velocity data. Two independent estimates of the mass sensitivity are obtained for z5d/ll,0.22 from ~i! the slope of the phase velocity curve and ~ii! the measurements of the group and phase velocity. These two estimates are shown to be consistent and we, therefore, conclude that it is possible to determine the mass sensitivity for a Love wave device with a given guiding layer thickness from measurements of the phase and group velocities.
Item Type: | Journal article | ||||
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Publication Title: | Journal of Applied Physics | ||||
Creators: | McHale, G., Martin, F. and Newton, M.I. | ||||
Publisher: | American Institute of Physics | ||||
Place of Publication: | Melville, NY | ||||
Date: | 2002 | ||||
Volume: | 92 | ||||
Number: | 6 | ||||
ISSN: | 0021-8979 | ||||
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Rights: | Copyright © 2002 American Institute of Physics | ||||
Divisions: | Schools > School of Science and Technology | ||||
Record created by: | EPrints Services | ||||
Date Added: | 09 Oct 2015 11:03 | ||||
Last Modified: | 09 Jun 2017 13:48 | ||||
URI: | https://irep.ntu.ac.uk/id/eprint/22174 |
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