Characterisation of the BaTiO/sub3//p-Si interface and applications

Evangelou, EK, Konofaos, N, Craven, MR, Cranton, WM ORCID: https://orcid.org/0000-0002-0142-7810 and Thomas, CB, 1999. Characterisation of the BaTiO/sub3//p-Si interface and applications. In: 7th International Conference on the Formation of Semiconductor Interfaces (ICFSI-7), Gothenburg, Sweden, 21-25 June 1999, Gothenburg, Sweden.

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Item Type:	Conference contribution
Creators:	Evangelou, E.K., Konofaos, N., Craven, M.R., Cranton, W.M. and Thomas, C.B.
Date:	1999
Divisions:	Schools > School of Science and Technology
Record created by:	EPrints Services
Date Added:	09 Oct 2015 11:05
Last Modified:	24 Mar 2022 14:42
URI:	https://irep.ntu.ac.uk/id/eprint/22566

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