Characterisation of the BaTiO/sub3//p-Si interface and applications

Evangelou, E.K., Konofaos, N., Craven, M.R., Cranton, W.M. and Thomas, C.B., 1999. Characterisation of the BaTiO/sub3//p-Si interface and applications. In: 7th International Conference on the Formation of Semiconductor Interfaces (ICFSI-7), Gothenburg, Sweden, 21-25 June 1999, Gothenburg, Sweden.

Full text not available from this repository.
Item Type: Conference contribution
Creators: Evangelou, E.K., Konofaos, N., Craven, M.R., Cranton, W.M. and Thomas, C.B.
Date: 1999
Divisions: Schools > School of Science and Technology
Depositing User: EPrints Services
Date Added: 09 Oct 2015 11:05
Last Modified: 19 Oct 2015 14:41
URI: http://irep.ntu.ac.uk/id/eprint/22566

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