Capacitance–conductance spectroscopic investigation of interfacial oxide layer in Ni/4H–SiC (0001) Schottky diode

Gupta, S.K., Shankar, B., Taube, W.R. ORCID: 0000-0003-4753-2015, Singh, J. and Akhtar, J., 2014. Capacitance–conductance spectroscopic investigation of interfacial oxide layer in Ni/4H–SiC (0001) Schottky diode. Physica B: Condensed Matter, 434, pp. 44-50. ISSN 0921-4526

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Item Type: Journal article
Publication Title: Physica B: Condensed Matter
Creators: Gupta, S.K., Shankar, B., Taube, W.R., Singh, J. and Akhtar, J.
Publisher: Elsevier
Date: 1 February 2014
Volume: 434
ISSN: 0921-4526
Identifiers:
NumberType
10.1016/j.physb.2013.10.042DOI
S0921452613006601Publisher Item Identifier
Divisions: Schools > School of Science and Technology
Depositing User: Linda Sullivan
Date Added: 14 Aug 2019 12:46
Last Modified: 15 Aug 2019 07:46
URI: http://irep.ntu.ac.uk/id/eprint/37305

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