Zographos, AN, Evans, JPO ORCID: https://orcid.org/0000-0001-9831-1461, Godber, SX and Robinson, M, 1997. Line-scan system for all-round inspection of objects. In: El-Hakim, SF, ed., Proceedings SPIE 3174: Videometrics V. Bellingham, Washington: SPIE. ISBN 0819425966
Full text not available from this repository.
Official URL: https://doi.org/10.1117/12.279789
Item Type: | Chapter in book |
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Description: | Paper presented at the conference: Optical Science, Engineering and Instrumentation '97, San Diego, California, United States, 30-31 July 1997. |
Creators: | Zographos, A.N., Evans, J.P.O., Godber, S.X. and Robinson, M. |
Publisher: | SPIE |
Place of Publication: | Bellingham, Washington |
Date: | 1997 |
ISBN: | 0819425966 |
Identifiers: | Number Type 10.1117/12.279789 DOI 1411057 Other |
Divisions: | Schools > School of Science and Technology |
Record created by: | Jonathan Gallacher |
Date Added: | 25 Feb 2021 11:11 |
Last Modified: | 25 Feb 2021 11:11 |
URI: | https://irep.ntu.ac.uk/id/eprint/42384 |
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