Line-scan system for all-round inspection of objects

Zographos, AN, Evans, JPO ORCID: https://orcid.org/0000-0001-9831-1461, Godber, SX and Robinson, M, 1997. Line-scan system for all-round inspection of objects. In: El-Hakim, SF, ed., Proceedings SPIE 3174: Videometrics V. Bellingham, Washington: SPIE. ISBN 0819425966

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Item Type:	Chapter in book
Description:	Paper presented at the conference: Optical Science, Engineering and Instrumentation '97, San Diego, California, United States, 30-31 July 1997.
Creators:	Zographos, A.N., Evans, J.P.O., Godber, S.X. and Robinson, M.
Publisher:	SPIE
Place of Publication:	Bellingham, Washington
Date:	1997
ISBN:	0819425966
Identifiers:	Number Type 10.1117/12.279789 DOI 1411057 Other
Divisions:	Schools > School of Science and Technology
Record created by:	Jonathan Gallacher
Date Added:	25 Feb 2021 11:11
Last Modified:	25 Feb 2021 11:11
URI:	https://irep.ntu.ac.uk/id/eprint/42384

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