Computer controlled capacitance transient determination of defect centres in epitaxial silicon

Marshall, A., 1984. Computer controlled capacitance transient determination of defect centres in epitaxial silicon. PhD, Nottingham Trent University.

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Item Type:	Thesis
Creators:	Marshall, A.
Date:	1984
ISBN:	9781369326338
Identifiers:	Number Type PQ10290384 Other
Divisions:	Schools > School of Science and Technology
Record created by:	Linda Sullivan
Date Added:	14 Jul 2021 09:56
Last Modified:	14 Jul 2021 09:56
URI:	https://irep.ntu.ac.uk/id/eprint/43465

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