Computer controlled capacitance transient determination of defect centres in epitaxial silicon

Marshall, A., 1984. Computer controlled capacitance transient determination of defect centres in epitaxial silicon. PhD, Nottingham Trent University.

Full text not available from this repository.
Item Type: Thesis
Creators: Marshall, A.
Date: 1984
ISBN: 9781369326338
Identifiers:
NumberType
PQ10290384Other
Divisions: Schools > School of Science and Technology
Record created by: Linda Sullivan
Date Added: 14 Jul 2021 09:56
Last Modified: 14 Jul 2021 09:56
URI: http://irep.ntu.ac.uk/id/eprint/43465

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