Exploring ICMetrics to detect abnormal program behaviour on embedded devices

ZHAI, X., APPIAH, K., EHSAN, S., HOWELLS, G., HU, H., GU, D. and MCDONALD-MAIER, K., 2015. Exploring ICMetrics to detect abnormal program behaviour on embedded devices. Journal of Systems Architecture. ISSN 1383-7621

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Item Type: Journal article
Description: Publication subject to an embargo until 14 July 2017.
Publication Title: Journal of Systems Architecture
Creators: Zhai, X., Appiah, K., Ehsan, S., Howells, G., Hu, H., Gu, D. and McDonald-Maier, K.
Publisher: Elsevier
Date: 2015
ISSN: 1383-7621
Identifiers:
NumberType
10.1016/j.sysarc.2015.07.007DOI
Divisions: Schools > School of Science and Technology
Depositing User: EPrints Services
Date Added: 09 Oct 2015 10:12
Last Modified: 23 Aug 2016 09:08
URI: http://irep.ntu.ac.uk/id/eprint/9321

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