Items where Author is "Toal, S"

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Journal article

Craven, MR, Cranton, WM, Toal, S and Reehal, HS, 1998. Characterization of BaTiO3 thin films deposited by RF magnetron sputtering for use in a.c. TFEL devices. Semiconductor Science and Technology, 13 (4), pp. 404-409.

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