Hot-electron effects in 2DEGS in Si of low Ndepl

Cooper, J, Ouali, FF ORCID logoORCID: https://orcid.org/0000-0002-6530-6786 and Challis, LJ, 1992. Hot-electron effects in 2DEGS in Si of low Ndepl. Semiconductor Science and Technology, 7 (3). ISSN 0268-1242

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Item Type: Journal article
Publication Title: Semiconductor Science and Technology
Creators: Cooper, J., Ouali, F.F. and Challis, L.J.
Date: 1992
Volume: 7
Number: 3
ISSN: 0268-1242
Divisions: Schools > School of Science and Technology
Record created by: EPrints Services
Date Added: 09 Oct 2015 11:12
Last Modified: 29 Sep 2021 08:52
URI: https://irep.ntu.ac.uk/id/eprint/24289

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