Line-scan system for all-round inspection of objects

Zographos, A.N., Evans, J.P.O. ORCID: 0000-0001-9831-1461, Godber, S.X. and Robinson, M., 1997. Line-scan system for all-round inspection of objects. In: S.F. El-Hakim, ed., Proceedings SPIE 3174: Videometrics V. Bellingham, Washington: SPIE. ISBN 0819425966

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Item Type: Chapter in book
Description: Paper presented at the conference: Optical Science, Engineering and Instrumentation '97, San Diego, California, United States, 30-31 July 1997.
Creators: Zographos, A.N., Evans, J.P.O., Godber, S.X. and Robinson, M.
Publisher: SPIE
Place of Publication: Bellingham, Washington
Date: 1997
ISBN: 0819425966
Divisions: Schools > School of Science and Technology
Record created by: Jonathan Gallacher
Date Added: 25 Feb 2021 11:11
Last Modified: 25 Feb 2021 11:11

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