Sparse interleaved sampling for high resolution focal construct geometry X-ray tomography

Evans, J.P.O., Elarnaut, F. ORCID: 0000-0003-0189-6665, Downes, D. ORCID: 0000-0002-4886-5260, Lee, W.K., Arnold, E.L. and Rogers, K., 2023. Sparse interleaved sampling for high resolution focal construct geometry X-ray tomography. Optics Express, 31 (10), pp. 15301-15315. ISSN 1094-4087

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We demonstrate interleaved sampling by multiplexing conical subshells within the tomosynthesis and raster scanning a phantom through a 150 kV shell X-ray beam. Each view comprises pixels sampled on a regular 1 mm grid, which is then upscaled by padding with null pixels before tomosynthesis. We show that upscaled views comprising 1% sample pixels and 99% null pixels increase the contrast transfer function (CTF) computed from constructed optical sections from approximately 0.6 line pairs/mm to 3 line pairs/mm. The driver of our method is to complement work concerning the application of conical shell beams to the measurement of diffracted photons for materials identification. Our approach is relevant to time-critical, and dose-sensitive analytical scanning applications in security screening, process control and medical imaging.

Item Type: Journal article
Publication Title: Optics Express
Creators: Evans, J.P.O., Elarnaut, F., Downes, D., Lee, W.K., Arnold, E.L. and Rogers, K.
Publisher: Optica Publishing Group
Date: 8 May 2023
Volume: 31
Number: 10
ISSN: 1094-4087
Rights: Published by Optica Publishing Group under the terms of the Creative Commons Attribution 4.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.
Divisions: Schools > School of Science and Technology
Record created by: Jeremy Silvester
Date Added: 28 Apr 2023 09:20
Last Modified: 28 Apr 2023 09:21

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