Optical coherence tomography in the 2-µm wavelength regime for paint and other high opacity materials

Cheung, CS, Daniel, JMO, Tokurakawa, M, Clarkson, WA and Liang, H ORCID: https://orcid.org/0000-0001-9496-406X, 2014. Optical coherence tomography in the 2-µm wavelength regime for paint and other high opacity materials. Optics Letters, 39 (22), pp. 6509-6512. ISSN 0146-9592

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Abstract

An optical coherence tomography (OCT) system using a compact fiber source emitting amplified spontaneous emission (ASE) at central wavelength of 1960nm with bandwidth of 40nm is developed to enhance the probing depth in highly scattering material with low water content. Examples of application to paint is used to demonstrate significantly improved penetration depth in high opacity material in the two-micron wavelength regime.

Item Type:	Journal article
Alternative Title:	Optical coherence tomography in the two-micron wavelength regime for paint and other high opacity material
Publication Title:	Optics Letters
Creators:	Cheung, C.S., Daniel, J.M.O., Tokurakawa, M., Clarkson, W.A. and Liang, H.
Publisher:	Optical Society of America
Place of Publication:	Washington, DC
Date:	2014
Volume:	39
Number:	22
ISSN:	0146-9592
Identifiers:	Number Type 10.1364/OL.39.006509 DOI
Divisions:	Schools > School of Science and Technology
Record created by:	EPrints Services
Date Added:	09 Oct 2015 10:01
Last Modified:	09 Jun 2017 13:16
URI:	https://irep.ntu.ac.uk/id/eprint/6484

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