Items where Author is "Peatfield, I"

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Chapter in book

CHAN, J., EVANS, P., WANG, X., GODBER, S., PEATFIELD, I., ROGERS, K., ROGERS, J. and DICKEN, A., 2010. Scatter enhanced 3D X-ray imaging for materials identification. In: 44th Annual 2010 IEEE International Carnahan Conference on Security Technology: Dolce Hayes Mansion Hotel, San Jose, California, USA, October 5-8, 2010: Proceedings. Piscataway: IEEE. ISBN 9781424474035

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