Items where Author is "Toal, S"
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CRAVEN, M.R., CRANTON, W.M., TOAL, S. and REEHAL, H.S., 1998. Characterization of BaTiO3 thin films deposited by RF magnetron sputtering for use in a.c. TFEL devices. Semiconductor Science and Technology, 13 (4), pp. 404-409.
