The dependence of the EL properties of sputtered films of ZnS:Mn device structure and post deposition annealing treatments

Thomas, C.B., Cranton, W.M. ORCID: 0000-0002-0142-7810, McClean, I., Spink, M., Simons, A. and Stevens, R., 1992. The dependence of the EL properties of sputtered films of ZnS:Mn device structure and post deposition annealing treatments. In: SID International Symposium Digest of Technical Papers.

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Item Type:	Conference contribution
Creators:	Thomas, C.B., Cranton, W.M., McClean, I., Spink, M., Simons, A. and Stevens, R.
Publisher:	Soc. Inf. Display
Date:	1992
Volume:	23
Divisions:	Schools > School of Science and Technology
Record created by:	EPrints Services
Date Added:	09 Oct 2015 11:10
Last Modified:	24 Mar 2022 14:49
URI:	https://irep.ntu.ac.uk/id/eprint/23713

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