Thomas, CB, Cranton, WM ORCID: https://orcid.org/0000-0002-0142-7810, McClean, I, Spink, M, Simons, A and Stevens, R, 1992. The dependence of the EL properties of sputtered films of ZnS:Mn device structure and post deposition annealing treatments. In: SID International Symposium Digest of Technical Papers.
Full text not available from this repository.Item Type: | Conference contribution |
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Creators: | Thomas, C.B., Cranton, W.M., McClean, I., Spink, M., Simons, A. and Stevens, R. |
Publisher: | Soc. Inf. Display |
Date: | 1992 |
Volume: | 23 |
Divisions: | Schools > School of Science and Technology |
Record created by: | EPrints Services |
Date Added: | 09 Oct 2015 11:10 |
Last Modified: | 24 Mar 2022 14:49 |
URI: | https://irep.ntu.ac.uk/id/eprint/23713 |
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