The dependence of the EL properties of sputtered films of ZnS:Mn device structure and post deposition annealing treatments

Thomas, C.B., Cranton, W.M., McClean, I., Spink, M., Simons, A. and Stevens, R., 1992. The dependence of the EL properties of sputtered films of ZnS:Mn device structure and post deposition annealing treatments. In: SID International Symposium Digest of Technical Papers.

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Item Type: Conference contribution
Creators: Thomas, C.B., Cranton, W.M., McClean, I., Spink, M., Simons, A. and Stevens, R.
Publisher: Soc. Inf. Display
Date: 1992
Volume: 23
Divisions: Schools > School of Science and Technology
Depositing User: EPrints Services
Date Added: 09 Oct 2015 11:10
Last Modified: 19 Oct 2015 14:42
URI: http://irep.ntu.ac.uk/id/eprint/23713

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