The dependence of the EL properties of sputtered films of ZnS:Mn device structure and post deposition annealing treatments

Thomas, CB, Cranton, WM, McClean, I, Spink, M, Simons, A and Stevens, R, 1992. The dependence of the EL properties of sputtered films of ZnS:Mn device structure and post deposition annealing treatments. In: SID International Symposium Digest of Technical Papers.

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Item Type: Conference contribution
Creators: Thomas, C.B., Cranton, W.M., McClean, I., Spink, M., Simons, A. and Stevens, R.
Publisher: Soc. Inf. Display
Date: 1992
Volume: 23
Divisions: Schools > School of Science and Technology
Depositing User: EPrints Services
Date Added: 09 Oct 2015 11:10
Last Modified: 19 Oct 2015 14:42
URI: http://irep.ntu.ac.uk/id/eprint/23713

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