Correction to Force field and a surface model database for silica to simulate interfacial properties in atomic resolution

Emami, F.S., Puddu, V. ORCID: 0000-0001-5079-5508, Berry, R.J., Varshney, V., Patwardhan, S.V., Perry, C.C. ORCID: 0000-0003-1517-468X and Heinz, H., 2016. Correction to Force field and a surface model database for silica to simulate interfacial properties in atomic resolution. Chemistry of Materials, 28 (1), pp. 406-407. ISSN 0897-4756

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Abstract

A correction of Figures 8 and 9 in the original manuscript is presented (Figures 8 and 9). Corrections are essential for Figure 8 while Figure 9 is only marginally affected and included for completeness.

Item Type: Journal article
Publication Title: Chemistry of Materials
Creators: Emami, F.S., Puddu, V., Berry, R.J., Varshney, V., Patwardhan, S.V., Perry, C.C. and Heinz, H.
Publisher: American Chemical Society
Date: 2016
Volume: 28
Number: 1
ISSN: 0897-4756
Identifiers:
NumberType
10.1021/acs.chemmater.5b04760DOI
Divisions: Schools > School of Science and Technology
Depositing User: Jonathan Gallacher
Date Added: 26 Feb 2016 11:52
Last Modified: 09 Jun 2017 13:59
URI: http://irep.ntu.ac.uk/id/eprint/27052

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