Correction to Force field and a surface model database for silica to simulate interfacial properties in atomic resolution

Emami, FS, Puddu, V ORCID: https://orcid.org/0000-0001-5079-5508, Berry, RJ, Varshney, V, Patwardhan, SV, Perry, CC ORCID: https://orcid.org/0000-0003-1517-468X and Heinz, H, 2016. Correction to Force field and a surface model database for silica to simulate interfacial properties in atomic resolution. Chemistry of Materials, 28 (1), pp. 406-407. ISSN 0897-4756

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Abstract

A correction of Figures 8 and 9 in the original manuscript is presented (Figures 8 and 9). Corrections are essential for Figure 8 while Figure 9 is only marginally affected and included for completeness.

Item Type:	Journal article
Publication Title:	Chemistry of Materials
Creators:	Emami, F.S., Puddu, V., Berry, R.J., Varshney, V., Patwardhan, S.V., Perry, C.C. and Heinz, H.
Publisher:	American Chemical Society
Date:	2016
Volume:	28
Number:	1
ISSN:	0897-4756
Identifiers:	Number Type 10.1021/acs.chemmater.5b04760 DOI
Divisions:	Schools > School of Science and Technology
Record created by:	Jonathan Gallacher
Date Added:	26 Feb 2016 11:52
Last Modified:	09 Jun 2017 13:59
URI:	https://irep.ntu.ac.uk/id/eprint/27052

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