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Prokopiou, D., McGovern, J., Davies, G., Godber, S. 
ORCID: 0000-0002-1979-3827, Evans, P. ORCID: 0000-0001-9831-1461, Dicken, A. ORCID: 0000-0002-0558-3773 and Rogers, K.,
2020.
A new parafocusing paradigm for X-ray diffraction.
Journal of Applied Crystallography, 53 (4), pp. 1073-1079.
ISSN 0021-8898
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Abstract
A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the flat-specimen approximation tolerated by conventional Bragg–Brentano geometries is not required. A theoretical framework, simulations and experimental results for both angular- and energy-dispersive measurement modes are presented and the scattering signatures compared with data obtained with a conventional pencil-beam arrangement.
| Item Type: | Journal article | ||||||
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| Publication Title: | Journal of Applied Crystallography | ||||||
| Creators: | Prokopiou, D., McGovern, J., Davies, G., Godber, S., Evans, P., Dicken, A. and Rogers, K. | ||||||
| Publisher: | International Union of Crystallography (IUCr) | ||||||
| Date: | 1 August 2020 | ||||||
| Volume: | 53 | ||||||
| Number: | 4 | ||||||
| ISSN: | 0021-8898 | ||||||
| Identifiers: |
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| Rights: | Copyright: © 2020 Danae Prokopiou et al.; Licence: Creative Commons Attribution (CC-BY). | ||||||
| Divisions: | Schools > School of Science and Technology | ||||||
| Record created by: | Linda Sullivan | ||||||
| Date Added: | 22 Sep 2020 11:19 | ||||||
| Last Modified: | 31 May 2021 15:16 | ||||||
| URI: | https://irep.ntu.ac.uk/id/eprint/40878 |
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