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Prokopiou, D, McGovern, J, Davies, G, Godber, S 
ORCID: https://orcid.org/0000-0002-1979-3827, Evans, P ORCID: https://orcid.org/0000-0001-9831-1461, Dicken, A ORCID: https://orcid.org/0000-0002-0558-3773 and Rogers, K,
2020.
A new parafocusing paradigm for X-ray diffraction.
Journal of Applied Crystallography, 53 (4), pp. 1073-1079.
ISSN 0021-8898
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Abstract
A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the flat-specimen approximation tolerated by conventional Bragg–Brentano geometries is not required. A theoretical framework, simulations and experimental results for both angular- and energy-dispersive measurement modes are presented and the scattering signatures compared with data obtained with a conventional pencil-beam arrangement.
| Item Type: | Journal article |
|---|---|
| Publication Title: | Journal of Applied Crystallography |
| Creators: | Prokopiou, D., McGovern, J., Davies, G., Godber, S., Evans, P., Dicken, A. and Rogers, K. |
| Publisher: | International Union of Crystallography (IUCr) |
| Date: | 1 August 2020 |
| Volume: | 53 |
| Number: | 4 |
| ISSN: | 0021-8898 |
| Identifiers: | Number Type 10.1107/s1600576720008651 DOI 1368755 Other |
| Rights: | Copyright: © 2020 Danae Prokopiou et al.; Licence: Creative Commons Attribution (CC-BY). |
| Divisions: | Schools > School of Science and Technology |
| Record created by: | Linda Sullivan |
| Date Added: | 22 Sep 2020 11:19 |
| Last Modified: | 31 May 2021 15:16 |
| URI: | https://irep.ntu.ac.uk/id/eprint/40878 |
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