A new parafocusing paradigm for X-ray diffraction

Prokopiou, D., McGovern, J., Davies, G., Godber, S. ORCID: 0000-0002-1979-3827, Evans, P. ORCID: 0000-0001-9831-1461, Dicken, A. ORCID: 0000-0002-0558-3773 and Rogers, K., 2020. A new parafocusing paradigm for X-ray diffraction. Journal of Applied Crystallography, 53 (4), pp. 1073-1079. ISSN 0021-8898

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Abstract

A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the flat-specimen approximation tolerated by conventional Bragg–Brentano geometries is not required. A theoretical framework, simulations and experimental results for both angular- and energy-dispersive measurement modes are presented and the scattering signatures compared with data obtained with a conventional pencil-beam arrangement.

Item Type: Journal article
Publication Title: Journal of Applied Crystallography
Creators: Prokopiou, D., McGovern, J., Davies, G., Godber, S., Evans, P., Dicken, A. and Rogers, K.
Publisher: International Union of Crystallography (IUCr)
Date: 1 August 2020
Volume: 53
Number: 4
ISSN: 0021-8898
Identifiers:
NumberType
10.1107/s1600576720008651DOI
1368755Other
Rights: Copyright: © 2020 Danae Prokopiou et al.; Licence: Creative Commons Attribution (CC-BY).
Divisions: Schools > School of Science and Technology
Record created by: Linda Sullivan
Date Added: 22 Sep 2020 11:19
Last Modified: 22 Sep 2020 11:19
URI: http://irep.ntu.ac.uk/id/eprint/40878

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