Nanoscale electrical characterization of indium tin oxide thin films by scanning spreading resistance microscopy (SSRM) [poster]

Tools

Karagiannidis, P.G., Hastas, N.A., Koutsogeorgis, D.C. ORCID: 0000-0001-6167-1084, Tsakonas, C. ORCID: 0000-0002-7342-3405, Logothetidis, S., Cranton, W.M. ORCID: 0000-0002-0142-7810 and Dimitriadis, C.A., 2010. Nanoscale electrical characterization of indium tin oxide thin films by scanning spreading resistance microscopy (SSRM) [poster]. In: IS -TCO (MRS) 3rd International Symposium on Transparent Conductive Oxides, Analipsi/Hersonissos, Crete, 17-22 October 2010.

Full text not available from this repository.

Item Type:	Conference contribution
Creators:	Karagiannidis, P.G., Hastas, N.A., Koutsogeorgis, D.C., Tsakonas, C., Logothetidis, S., Cranton, W.M. and Dimitriadis, C.A.
Date:	2010
Divisions:	Schools > School of Science and Technology
Record created by:	EPrints Services
Date Added:	09 Oct 2015 10:09
Last Modified:	04 Feb 2022 15:52
URI:	https://irep.ntu.ac.uk/id/eprint/8591