Nanoscale electrical characterization of indium tin oxide thin films by scanning spreading resistance microscopy (SSRM) [poster]

Karagiannidis, PG, Hastas, NA, Koutsogeorgis, DC ORCID: https://orcid.org/0000-0001-6167-1084, Tsakonas, C ORCID: https://orcid.org/0000-0002-7342-3405, Logothetidis, S, Cranton, WM ORCID: https://orcid.org/0000-0002-0142-7810 and Dimitriadis, CA, 2010. Nanoscale electrical characterization of indium tin oxide thin films by scanning spreading resistance microscopy (SSRM) [poster]. In: IS -TCO (MRS) 3rd International Symposium on Transparent Conductive Oxides, Analipsi/Hersonissos, Crete, 17-22 October 2010.

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Item Type:	Conference contribution
Creators:	Karagiannidis, P.G., Hastas, N.A., Koutsogeorgis, D.C., Tsakonas, C., Logothetidis, S., Cranton, W.M. and Dimitriadis, C.A.
Date:	2010
Divisions:	Schools > School of Science and Technology
Record created by:	EPrints Services
Date Added:	09 Oct 2015 10:09
Last Modified:	04 Feb 2022 15:52
URI:	https://irep.ntu.ac.uk/id/eprint/8591

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