Nanoscale electrical characterization of indium tin oxide thin films by scanning spreading resistance microscopy (SSRM) [poster]

KARAGIANNIDIS, P.G., HASTAS, N.A., KOUTSOGEORGIS, D.C., TSAKONAS, C., LOGOTHETIDIS, S., CRANTON, W.M. and DIMITRIADIS, C.A., 2010. Nanoscale electrical characterization of indium tin oxide thin films by scanning spreading resistance microscopy (SSRM) [poster]. In: IS -TCO (MRS) 3rd International Symposium on Transparent Conductive Oxides, Analipsi/Hersonissos, Crete, 17-22 October 2010.

Full text not available from this repository.
Item Type: Conference contribution
Creators: Karagiannidis, P.G., Hastas, N.A., Koutsogeorgis, D.C., Tsakonas, C., Logothetidis, S., Cranton, W.M. and Dimitriadis, C.A.
Date: 2010
Divisions: Schools > School of Science and Technology
Depositing User: EPrints Services
Date Added: 09 Oct 2015 10:09
Last Modified: 02 Dec 2016 09:54
URI: http://irep.ntu.ac.uk/id/eprint/8591

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