Evangelou, E.K., Konofaos, N., Craven, M.R., Cranton, W.M. ORCID: 0000-0002-0142-7810 and Thomas, C.B.,
2000.
Characterisation of the BaTiO/sub3//p-Si interface and applications.
Applied Surface Science, 166, pp. 504-507.
ISSN 0169-4332
Official URL: https://doi.org/10.1016/S0169-4332(00)00483-9
Item Type: | Journal article | ||||||
---|---|---|---|---|---|---|---|
Publication Title: | Applied Surface Science | ||||||
Creators: | Evangelou, E.K., Konofaos, N., Craven, M.R., Cranton, W.M. and Thomas, C.B. | ||||||
Publisher: | Elsevier | ||||||
Date: | 2000 | ||||||
Volume: | 166 | ||||||
ISSN: | 0169-4332 | ||||||
Identifiers: |
|
||||||
Divisions: | Schools > School of Science and Technology | ||||||
Record created by: | EPrints Services | ||||||
Date Added: | 09 Oct 2015 09:40 | ||||||
Last Modified: | 01 Mar 2024 16:57 | ||||||
URI: | https://irep.ntu.ac.uk/id/eprint/921 |
Actions (login required)
![]() |
Edit View |
Views
Views per month over past year
Downloads
Downloads per month over past year