Characterisation of the BaTiO/sub3//p-Si interface and applications

Evangelou, E.K., Konofaos, N., Craven, M.R., Cranton, W.M. and Thomas, C.B., 2000. Characterisation of the BaTiO/sub3//p-Si interface and applications. Applied Surface Science, 166, pp. 504-507.

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Item Type: Journal article
Publication Title: Applied Surface Science
Creators: Evangelou, E.K., Konofaos, N., Craven, M.R., Cranton, W.M. and Thomas, C.B.
Date: 2000
Volume: 166
Divisions: Schools > School of Science and Technology
Depositing User: EPrints Services
Date Added: 09 Oct 2015 09:40
Last Modified: 19 Oct 2015 14:21
URI: http://irep.ntu.ac.uk/id/eprint/921

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