Characterisation of the BaTiO/sub3//p-Si interface and applications

Evangelou, EK, Konofaos, N, Craven, MR, Cranton, WM ORCID: https://orcid.org/0000-0002-0142-7810 and Thomas, CB, 2000. Characterisation of the BaTiO/sub3//p-Si interface and applications. Applied Surface Science, 166, pp. 504-507. ISSN 0169-4332

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Item Type:	Journal article
Publication Title:	Applied Surface Science
Creators:	Evangelou, E.K., Konofaos, N., Craven, M.R., Cranton, W.M. and Thomas, C.B.
Publisher:	Elsevier
Date:	2000
Volume:	166
ISSN:	0169-4332
Identifiers:	Number Type 10.1016/S0169-4332(00)00483-9 DOI 391887 Other
Divisions:	Schools > School of Science and Technology
Record created by:	EPrints Services
Date Added:	09 Oct 2015 09:40
Last Modified:	01 Mar 2024 16:57
URI:	https://irep.ntu.ac.uk/id/eprint/921

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