Items where Author is "Evangelou, EK"

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Number of items: 5.

Journal article

KASTANIS, L., SPEAR, J., SARGENTIS, C., KONOFAOS, N., TSAMAKIS, D., KOUTSOGEORGIS, D.C. and EVANGELOU, E.K., 2018. Memory performance of MOS structure embedded with laser annealed gold NCs. Solid-State Electronics, 148, pp. 63-69. ISSN 0038-1101

EVANGELOU, E.K., WIEMER, C., FANCIULLI, M., SETHU, M. and CRANTON, W., 2003. Electrical and structural characteristics of yttrium oxide films deposited by rf-magnetron sputtering on n-Si. Journal of Applied Physics, 94 (1), pp. 318-325. ISSN 0021-8979

EVANGELOU, E.K., KONOFAOS, N., ASLANOGLOU, X., KENNOU, S. and THOMAS, C.B., 2001. Characterization of BaTiO3 thin films on p-Si. Materials Science in Semiconductor Processing, 4, pp. 305-307. ISSN 1369-8001

EVANGELOU, E.K., KONOFAOS, N., CRAVEN, M.R., CRANTON, W.M. and THOMAS, C.B., 2000. Characterisation of the BaTiO/sub3//p-Si interface and applications. Applied Surface Science, 166, pp. 504-507.

Conference contribution

EVANGELOU, E.K., KONOFAOS, N., CRAVEN, M.R., CRANTON, W.M. and THOMAS, C.B., 1999. Characterisation of the BaTiO/sub3//p-Si interface and applications. In: 7th International Conference on the Formation of Semiconductor Interfaces (ICFSI-7), Gothenburg, Sweden, 21-25 June 1999, Gothenburg, Sweden.

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