Influence of viscoelasticity and interfacial slip on acoustic wave sensors

McHale, G, Lucklum, R, Newton, MI ORCID: https://orcid.org/0000-0003-4231-1002 and Cowen, JA, 2000. Influence of viscoelasticity and interfacial slip on acoustic wave sensors. Journal of Applied Physics, 88 (12), pp. 7304-7312. ISSN 0021-8979

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Abstract

Acoustic wave devices with shear horizontal displacements, such as quartz crystal microbalances (QCM) and shear horizontally polarised surface acoustic wave (SH-SAW) devices provide sensitive probes of changes at solid-solid and solid- liquid interfaces. Increasingly the surfaces of acoustic wave devices are being chemically or physically modified to alter surface adhesion or coated with one or more layers to amplify their response to any change of mass or material properties. In this work, we describe a model that provides a unified view of the modification in the shear motion in acoustic wave systems by multiple finite thickness loadings of viscoelastic fluids. This model encompasses QCM and other classes of acoustic wave devices based on a shear motion of the substrate surface and is also valid whether the coating film has a liquid or solid character. As a specific example, the transition of a coating from liquid to solid is modelled using a single relaxation time Maxwell model. The correspondence between parameters from this physical model and parameters from alternative acoustic impedance models is given explicitly. The characteristic changes in QCM frequency and attenuation as a function of thickness are illustrated for a single layer device as the coating is varied from liquid-like to that of an amorphous solid. Results for a double layer structure are given explicitly and the extension of the physical model to multiple layers is described.

Item Type:	Journal article
Description:	Post-print (file reconstructed from pre-print file; may not be the final version)
Publication Title:	Journal of Applied Physics
Creators:	McHale, G., Lucklum, R., Newton, M.I. and Cowen, J.A.
Date:	2000
Volume:	88
Number:	12
ISSN:	0021-8979
Identifiers:	Number Type 10.1063/1.1326855 DOI
Rights:	Copyright ©2000 American Institute of Physics
Divisions:	Schools > School of Science and Technology
Record created by:	EPrints Services
Date Added:	09 Oct 2015 10:34
Last Modified:	09 Jun 2017 13:33
URI:	https://irep.ntu.ac.uk/id/eprint/15060

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