Redgate, J, Al-Habaibeh, A ORCID: https://orcid.org/0000-0002-9867-6011, Su, D ORCID: https://orcid.org/0000-0002-9541-8869, Wilmhurst, T and Rudd, J, 2011. Evaluation of component reliability using data derived from infrared thermography. Key Engineering Materials, 450, pp. 275-278.
Full text not available from this repository.Item Type: | Journal article |
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Publication Title: | Key Engineering Materials |
Creators: | Redgate, J., Al-Habaibeh, A., Su, D., Wilmhurst, T. and Rudd, J. |
Publisher: | Trans Tech Publications |
Date: | 2011 |
Volume: | 450 |
Divisions: | Schools > School of Architecture, Design and the Built Environment |
Record created by: | EPrints Services |
Date Added: | 09 Oct 2015 10:53 |
Last Modified: | 09 Jun 2017 13:44 |
URI: | https://irep.ntu.ac.uk/id/eprint/19756 |
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