Neto, J, Zumeit, A, Navaraj, W ORCID: https://orcid.org/0000-0003-4753-2015 and Dahiya, R, 2019. Reliability investigation of via-bridges for flexible electronics. In: 2019 IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS), Glasgow, 8 July 2019.
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Official URL: http://doi.org/10.1109/fleps.2019.8792275
Item Type: | Conference contribution |
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Creators: | Neto, J., Zumeit, A., Navaraj, W. and Dahiya, R. |
Date: | July 2019 |
Identifiers: | Number Type 10.1109/fleps.2019.8792275 DOI |
Divisions: | Schools > School of Science and Technology |
Record created by: | Linda Sullivan |
Date Added: | 15 Aug 2019 13:39 |
Last Modified: | 15 Aug 2019 13:39 |
URI: | https://irep.ntu.ac.uk/id/eprint/37339 |
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