Scatter enhanced 3D X-ray imaging for materials identification

Chan, J, Evans, P ORCID: https://orcid.org/0000-0001-9831-1461, Wang, X, Godber, S, Peatfield, I, Rogers, K, Rogers, J and Dicken, A, 2010. Scatter enhanced 3D X-ray imaging for materials identification. In: 44th Annual 2010 IEEE International Carnahan Conference on Security Technology: Dolce Hayes Mansion Hotel, San Jose, California, USA, October 5-8, 2010: Proceedings. Piscataway: IEEE. ISBN 9781424474035

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Item Type:	Chapter in book
Description:	Paper presented at 2010 IEEE International Carnahan Conference on Security Technology (ICCST), San Jose, California, United States, 5-8 October 2010.
Creators:	Chan, J., Evans, P., Wang, X., Godber, S., Peatfield, I., Rogers, K., Rogers, J. and Dicken, A.
Publisher:	IEEE
Place of Publication:	Piscataway
Date:	2010
ISBN:	9781424474035
Identifiers:	Number Type 10.1109/ccst.2010.5678684 DOI 1411046 Other
Divisions:	Schools > School of Science and Technology
Record created by:	Jonathan Gallacher
Date Added:	25 Feb 2021 10:28
Last Modified:	25 Feb 2021 11:15
URI:	https://irep.ntu.ac.uk/id/eprint/42380

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