Solid state excitation‐emission spectroscopy for the non‐destructive analysis of band‐gap & defect states in inorganic and organic semiconductors

Oliver, DJ ORCID: https://orcid.org/0000-0001-7877-0900, Volkov, VV and Perry, CC ORCID: https://orcid.org/0000-0003-1517-468X, 2023. Solid state excitation‐emission spectroscopy for the non‐destructive analysis of band‐gap & defect states in inorganic and organic semiconductors. Advanced Materials Interfaces, 10 (3): 2202048. ISSN 2196-7350

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Item Type:	Journal article
Publication Title:	Advanced Materials Interfaces
Creators:	Oliver, D.J., Volkov, V.V. and Perry, C.C.
Publisher:	Wiley
Date:	26 January 2023
Volume:	10
Number:	3
ISSN:	2196-7350
Identifiers:	Number Type 10.1002/admi.202202048 DOI 1643161 Other
Divisions:	Schools > School of Science and Technology
Record created by:	Laura Ward
Date Added:	03 Feb 2023 10:50
Last Modified:	03 Feb 2023 10:50
URI:	https://irep.ntu.ac.uk/id/eprint/48153

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