Physicochemical analysis of nanoscale metal oxide thin film precursors via infrared spectroscopic ellipsometry

Koutsiaki, C, Koutsogeorgis, DC ORCID logoORCID: https://orcid.org/0000-0001-6167-1084 and Kalfagiannis, N ORCID logoORCID: https://orcid.org/0000-0002-4030-5525, 2023. Physicochemical analysis of nanoscale metal oxide thin film precursors via infrared spectroscopic ellipsometry. The Journal of Physical Chemistry C. ISSN 1932-7447

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Item Type: Journal article
Publication Title: The Journal of Physical Chemistry C
Creators: Koutsiaki, C., Koutsogeorgis, D.C. and Kalfagiannis, N.
Publisher: American Chemical Society (ACS)
Date: 7 August 2023
ISSN: 1932-7447
Identifiers:
Number
Type
10.1021/acs.jpcc.3c01384
DOI
1790051
Other
Divisions: Schools > School of Science and Technology
Record created by: Jeremy Silvester
Date Added: 09 Aug 2023 09:40
Last Modified: 09 Aug 2023 09:40
URI: https://irep.ntu.ac.uk/id/eprint/49533

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